eISSN 2288-6559
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Jang SG, Gwon OH, Shin B, Ryu D, , Yu YJ.
Scanning Gate Microscopic Investigation of Graphene Nanoribbon Underneath Dielectric Layer
. Applied Science and Convergence Technology 2024;33:50-52.
https://doi.org/10.5757/ASCT.2024.33.2.50
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eISSN 2288-6559
