High interlayer resistance effects on carrier scattering mechanism in a multilayer rhenium disulfide was explored in this study. The obtained temperature (T) -dependent carrier mobility is systematically analyzed by employing Matthiessen’s rule for Coulomb impurity scattering, phonon scattering, and interlayer resistance scattering. The observed anomalous carrier mobility enhancement when T is higher than 380 K was ascribed to a quick suppression of effective interlayer resistance, promoting consequently a rapid channel migration at a given gate and drain electrostatic bias condition.
Gyeong-Ji Kim, Lina Kim, and Oh Seok Kwon
ASCT 2023; 32(1): 1-6
Bhimanaboina Ramulu and Jae Su Yu
ASCT 2024; 33(3): 53-61
ASCT
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