Fig. 6. Scanning electron microscopy (SEM) images of the surface of (a) bare SiO₂/Si wafer, (b) as-deposited MoS₂ film, and (c) EBI-treated MoS₂ film. (d) Cross-sectional transmission electron microscopy (TEM) image of EBI-treated MoS₂ film. Scale bars in SEM and TEM images represent 100 and 5 nm, respectively.

Applied Science and Convergence Technology 2020;29:186~189 https://doi.org/10.5757/ASCT.2020.29.6.186

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