eISSN 2288-6559
Fig. 6.
Fig. 6. Scanning electron microscopy (SEM) images of the surface of (a) bare SiO2/Si wafer, (b) as-deposited MoS2 film, and (c) EBI-treated MoS2 film. (d) Cross-sectional transmission electron microscopy (TEM) image of EBI-treated MoS2 film. Scale bars in SEM and TEM images represent 100 and 5 nm, respectively.
Applied Science and Convergence Technology 2020;29:186~189
© Appl. Sci. Converg. Technol.

© The Korean Vacuum Society. All Rights Reserved. / Powered by INFOrang Co., Ltd