Fig. 2. Cross-sectional ADF-STEM images of WS2 on Au foil (a) and (c) before, and (b) and (d) after S-intercalation, with (e) and (f) showing corresponding EDX element mapping images. (g) and (h) EDX intensity profiles along the white-dashed arrows in (e) and (f), respectively.

Applied Science and Convergence Technology 2021;30:45~49 https://doi.org/10.5757/ASCT.2021.30.2.45

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