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Fig. 4.
Fig. 4. (a) and (b) Optical and AFM topography images of transferred WS₂ grains, after S-intercalation (AFM image was obtained from the red-dashed box, and the inset shows a height profile along the white-dashed line). (c) and (d) Raman and photoluminescence spectra, respectively, for transferred WS2. (e) Optical image of transferred, cm-scale monolayer WS2 film, with photograph inset. (f) Optical and (g) AFM topography images of transferred WS2 grains without S-intercalation. The inset in (f) shows WS2 grains left on the Au surface after the transfer, and the yellow-dashed line indicates the border line of the leftover WS2 grains, while the scale bar in the inset of panel (f) represents 10 μm.
Applied Science and Convergence Technology 2021;30:45~49 https://doi.org/10.5757/ASCT.2021.30.2.45
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