Applied Science and Convergence Technology

Fig. 4. (a) and (b) Optical and AFM topography images of transferred WS₂ grains, after S-intercalation (AFM image was obtained from the red-dashed box, and the inset shows a height profile along the white-dashed line). (c) and (d) Raman and photoluminescence spectra, respectively, for transferred WS₂. (e) Optical image of transferred, cm-scale monolayer WS₂ film, with photograph inset. (f) Optical and (g) AFM topography images of transferred WS₂ grains without S-intercalation. The inset in (f) shows WS₂ grains left on the Au surface after the transfer, and the yellow-dashed line indicates the border line of the leftover WS₂ grains, while the scale bar in the inset of panel (f) represents 10 μm.

Applied Science and Convergence Technology 2021;30:45~49 https://doi.org/10.5757/ASCT.2021.30.2.45