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Fig. 7.
Fig. 7. XRD patterns of (a) a bare sapphire substrate, (b) as-deposited Y2O3:Eu films, and the films annealed at (c) 800 °C, (d) 1000 °C, (e) 1200 °C, and (f) 1300°C.
Applied Science and Convergence Technology 2021;30:34~37 https://doi.org/10.5757/ASCT.2021.30.1.34
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