Fig. 3. (a) XRD patterns of spin-coated TiO₂ after 450 °C annealing for 1 h (black, bottom), as-deposited RFRS TiO₂ (blue, middle), and RFRS TiO₂ after annealing for 1 h at 450 °C (red, top) (∗: anatase (101) TiO₂ stucture). (b) XRD patterns magnified in the 20−30∘ region for RFRS TiO₂ with and without annealing process.

Applied Science and Convergence Technology 2022;31:116~119 https://doi.org/10.5757/ASCT.2022.31.5.116

© Appl. Sci. Converg. Technol.