Fig. 4. (a) XPS depth profiles indicating indium concentration in spin-coated TiO₂ after annealing process (black square), as-deposited RFRS TiO₂ (red circle), and RFRS TiO₂ after annealing process (blue triangle). (b) Sheet resistance of ITO substrates depending on the annealing temperature.

Applied Science and Convergence Technology 2022;31:116~119 https://doi.org/10.5757/ASCT.2022.31.5.116

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