Fig. 5. Comparison of J-V curves between spin-coated TiO₂ (black square) and RFRS TiO₂ (red circle) after annealing at 450 °C. The upper and lower insets are the schematic diagram of the device architecture and the statistical efficiency graph of the PSCs, respectively.

Applied Science and Convergence Technology 2022;31:116~119 https://doi.org/10.5757/ASCT.2022.31.5.116

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