ASCT로고
eISSN 2288-6559
Fig. 6.
Fig. 6. J-V curves of devices using RFRS TiO2 layers at different annealing temperatures (inset: the staticalcal efficiency graph of the PSCs for each annealing temperature).
Applied Science and Convergence Technology 2022;31:116~119 https://doi.org/10.5757/ASCT.2022.31.5.116
© Appl. Sci. Converg. Technol.

© The Korean Vacuum Society. All Rights Reserved. / Powered by INFOrang Co., Ltd