Fig. 4. (a) Optical (inset: photograph), (b) AFM topography, and (c) Raman I_2D/I_G mapping images of SC graphene film after transfer onto SiO₂/Si substrate. (d) SEM image and (e) corresponding nine SAED patterns of SC graphene film transferred onto TEM grid. The SAED patterns are obtained from nine different regions indicated by Roman numerals in (d). (f) HR-TEM image of graphene film.

Applied Science and Convergence Technology 2023;32:26~29 https://doi.org/10.5757/ASCT.2023.32.1.26

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