ASCT로고
eISSN 2288-6559
Fig. 1.
Fig. 1. Schematic of the cutoff probe: (a) cross-sectional view, (b) view from above, and (c) circuit model including a lumped circuit element.
Applied Science and Convergence Technology 2024;33:41~44 https://doi.org/10.5757/ASCT.2024.33.2.41
© Appl. Sci. Converg. Technol.

© The Korean Vacuum Society. All Rights Reserved. / Powered by INFOrang Co., Ltd