ASCT로고
eISSN 2288-6559
Fig. 2. (a) Schematic of the fabrication process, (b) OM image of the fabricated device, and (c) schematic of the electrical measurement.
Applied Science and Convergence Technology 2024;33:104~107 https://doi.org/10.5757/ASCT.2024.33.4.104
© Appl. Sci. Converg. Technol.

© The Korean Vacuum Society. All Rights Reserved. / Powered by INFOrang Co., Ltd