Fig. 1. (a)–(d) Top-view and cross-section SEM images of the Cs_0.22FA_0.78PbI₃ perovskite films fabricated using DMSO and varying concentrations of NMP (scale bar: 500 nm). The thickness of the perovskite is indicated in the cross-section SEM images.

Applied Science and Convergence Technology 2024;33:156~159 https://doi.org/10.5757/ASCT.2024.33.6.156

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