Fig. 1. XRD profile of Cr₂Se₃ flakes grown under different conditions and diffraction planes. (a) XRD patterns of Cr₂Se₃ grown via CVD on SiO2/Si (black) and HOPG (red), CVT-grown bulk Cr₂Se₃ (blue), along with the reference powder diffraction pattern of bulk Cr₂Se₃ (gray). (b) Crystal structure of rhombohedral Cr₂Se₃ with the (003) and (113) diffraction planes highlighted. Cr and Se atoms are color-coded in blue and green, respectively.

Applied Science and Convergence Technology 2025;34:38~41 https://doi.org/10.5757/ASCT.2025.34.1.38

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