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Fig. 1.
Fig. 1. (Color online) (a) Schematic illustration of CVD set up. (b) Photograph of bare SiO2/Si substrate and as-grown MoS2 film. (c) Optical microscopy, (d) AFM topography, (e) Raman intensity mapping images, (f) Raman, and (g) PL spectra of transferred MoS2 grain, respectively. The AFM, Raman, and PL measurements were taken at the area marked with white-dashed box in the optical microscopy image.
Applied Science and Convergence Technology 2019;28:60~65 https://doi.org/10.5757/ASCT.2019.28.3.60
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