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Applied Science and Convergence Technology 2007; 16(1): 33-39

Published online January 1, 2007

Copyright © The Korean Vacuum Society.

Modification and Repair of a Carbon Nanotube-based Device Using an Atomic Force Microscope

Ji-Yong Park,Yong Sun Kim,Youngmu Oh

Abstract

Electrical and mechanical modifications of devices based on carbon nanotubes (CNTs) using an atomic force microscope (AFM) in the forms of cutting and reconnection of CNTs are demonstrated. In addition to the modifications, electrostatic force microscopy is used to visualize the cutting and reconnection of CNTs. In this way, AFM is shown to be a useful tool in local modifications and manipulations of CNT-based devices.

Keywords: 탄소나노튜브,분자제어,분자조작,원자힘현미경,Carbon nanotube,Molecular control,Molecular manipulation,Atomic force microscopy

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