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Applied Science and Convergence Technology 2001; 10(4): 403-410

Published online December 1, 2001

Copyright © The Korean Vacuum Society.

Improvement of electromigration characteristics in using Al interlayer

Jeung Hwan Lee,Byung Nam Park,Sie Young Choi

Abstract

Acceleration in integration density and speed performance of ULSI circuits require miniaturization of CMOS and interconnections as well as higher current density capabilities for transistors. A leading candidate to substitute Al-alloy is Cu, which has lower resistivity and higher melting point. So we can expect much higher electromigration resistance. In this paper, we are going to explain the major features of EM for MOCVD Cu according to variant conditions. We compared the life time and activation energy of MOCVD Cu with those of E-beam Cu and AI in the same conditions. The electromigration experiments were performed with Cu/Al/TiN multilayer. Experimental results shows that the deposition rate and electromigration characteristics of Cu thin film were improved by the Al interlayer.

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