Applied Science and Convergence Technology 2019; 28(3): 51-54
Published online May 31, 2019
https://doi.org/10.5757/ASCT.2019.28.3.51
© The Korean Vacuum Society.
Young-Jun Yu
Department of Physics, Chungnam National University, Daejeon 34134, Republic of Korea
Correspondence to:*E-mail: yjyu@cnu.ac.kr
This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-CommercialLicense (http://creativecommons.org/licenses/by-nc/3.0) which permits unrestricted non-commercial use, distribution,and reproduction in any medium, provided the original work is properly cited.
After the oxidation process of graphene was shown to lead to zero conductance (~ 0 μS) based on the electrochemistry, the natural reduction in the graphene oxide behavior resulting in a recovery of the conductance (~ 200 μS) was observed under exposure to ambient conditions during a 24 h period. Furthermore, damage to the graphene oxide surface during the repeated atomic force microscopy scanning process owing to the weakening of the van der Waals force between the oxidized graphene and SiO2 substrate was characterized. These results provide significant information regarding the remaining time of electrochemical oxidation and the mechanical properties of graphene.
Keywords: Graphene, Reduction, Oxidation, Graphene oxide, Electrochemistry