Applied Science and Convergence Technology 2019; 28(6): 207-212
Published online November 30, 2019
https://doi.org/10.5757/ASCT.2019.28.6.207
© The Korean Vacuum Society.
Jimin Chaea , Seoung-Hun Kangb , Young-Kyun Kwonb , c , and Mann-Ho Choa , *
aDepartment of Physics, Yonsei University, Seoul 03722, Republic of Korea
bKorea Institute for Advanced Study, Seoul 02455, Republic of Korea
cDepartment of Physics and Research Institute for Basic Sciences, Kyung-Hee University, Seoul 02447, Republic of Korea
Correspondence to:mh.cho@yonsei.ac.kr
This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-CommercialLicense (http://creativecommons.org/licenses/by-nc/3.0) which permits unrestricted non-commercial use, distribution,and reproduction in any medium, provided the original work is properly cited.
Topological insulators (TIs) have gained considerable attention owing to their topologically protected helical edge states called topological surface states. To employ TIs, it is necessary to reduce film thickness and suppress effects from the bulk carrier. When the film thickness is less than 5 quintuple layers (QLs), the top and bottom surface states overlap, thereby increasing surface bandgap. In this study, we investigate the suppression of the hybridization of surface states in a 3-QL Bi2Se3/graphene heterostructure. In the 3-QL Bi2Se3 film grown on graphene, surface states affected by strain, and band bending effects from graphene are localized to the top and bottom and possess a closed bandgap. Further, we investigated transport properties in the 3-QL Bi2Se3/graphene heterostructure and verified the independent transport channels of Bi2Se3 and graphene, and the long coherence length of 534 nm. In conclusion, the closed bandgap and long coherence length in the 3-QL Bi2Se3/graphene heterostructure implies that the proximity effect in a TI/non-TI heterostructure can be attractive for future applications, beyond the physical and topological thickness limit.
Keywords: Topological insulator, Heterostructure, Coherence length